Integrated femtosecond pulse and frequency comb sources are critical components for a wide range of applications, including optical atomic clocks, microwave photonics, spectroscopy, optical wave synthesis, frequency conversion, communications, lidar, optical computing and astronomy. The leading approaches for on-chip pulse generation rely on mode-locking inside microresonators with either third-order nonlinearity or with semiconductor gain. These approaches, however, are limited in noise performance, wavelength and repetition rate tunability .
View Article and Find Full Text PDFA noninvasive diagnostic technique based on wavelength-resolved and magnified infrared images of weakly scattered light from a silicon photonic device may be useful to infer component characteristics, such as waveguide-resonator coupling, loss, quality factor, etc., at multiple locations, without the constraint of input/output couplers. Here, we demonstrate the benefit of high dynamic range microscope imaging for a silicon coupled microresonator device.
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