Unveiling heterogeneity of hysteresis in perovskite thin films.

The phenomenon of current-voltage hysteresis observed in perovskite-based optoelectronic devices is a critical issue that complicates the accurate assessment of device parameters, thereby impacting performance and applicability. Despite extensive research efforts aimed at deciphering the origins of hysteresis, its underlying causes remain a subject of considerable debate. By employing nanoscale investigations to elucidate the relationship between hysteresis and morphological characteristics, this study offers a detailed exploration of photocurrent-voltage hysteresis at the nanoscale within perovskite optoelectronic devices.

Nanoscale light- and voltage-induced lattice strain in perovskite thin films.

We report on localized nonlinear lattice deformation and nanoscale structural rearrangement in methylammonium lead triiodide films triggered by the combined action of light and voltage. These effects, revealed by second harmonic piezoresponse force microscopy, are connected with organic cation motion, implicating localized cation migration as a key contributor to perovskite optoelectronic device instability under operating conditions.