Electron beam and thermal stabilities of MFM-300(M) metal-organic frameworks.

This work reports the thermal and electron beam stabilities of a series of isostructural metal-organic frameworks (MOFs) of type MFM-300(M) (M = Al, Ga, In, Cr). MFM-300(Cr) was most stable under the electron beam, having an unusually high critical electron fluence of 1111 e Å while the Group 13 element MOFs were found to be less stable. Within Group 13, MFM-300(Al) had the highest critical electron fluence of 330 e Å, compared to 189 e Å and 147 e Å for the Ga and In MOFs, respectively.