In this paper, diamond-based vertical p-n junction diodes with step edge termination are investigated using a Silvaco simulation (Version 5.0.10.
View Article and Find Full Text PDFIn developing low-power electronics, low-voltage transistors have been intensively investigated. One of the most important findings is that some high- oxide gate dielectrics can lead to remarkable enhancement of apparent mobility in thin-film transistors (TFTs), which is not clearly understood. Here, we investigate InO TFTs with solution-processed AlO dielectrics.
View Article and Find Full Text PDFACS Appl Mater Interfaces
July 2018
In this study, a NiO-based resistive memristor was manufactured using a solution combustion method. In this device, both analog and digital bipolar resistive switching were observed. They are dependent on the stressed bias voltage.
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