In the present study, europium (III) oxide (Eu O )-doped polystyrene (PS) polymer films were synthesized using a solution-casting technique for different filler levels. These films were irradiated with 5, 25 and 50 kGy γ doses and characterized using various techniques, viz. X-ray diffraction (XRD), and UV-visible and photoluminescence (PL) spectroscopies as a function of composition level and radiation dose.
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