Inner-shell excitation spectroscopy and X-ray photoemission electron microscopy of adhesion promoters.

The C 1s, Si 2p, Si 2s, and O 1s inner-shell excitation spectra of vinyltriethoxysilane, trimethylethoxysilane, and vinyltriacetoxysilane have been recorded by electron energy loss spectroscopy under scattering conditions dominated by electric dipole transitions. The spectra are converted to absolute optical oscillator strength scales and interpreted with the aid of ab initio calculations of the inner-shell excitation spectra of model compounds. Electron energy loss spectra recorded in a transmission electron microscope on partly cured adhesion promoter, atomic force micrographs, and images and X-ray absorption spectra from X-ray photoemission electron microscopy of as-spun and cured vinyltriacetoxysilane-based adhesion promoter films on silicon are presented.

Inner shell excitation spectroscopy of biphenyl and substituted biphenyls: probing ring-ring delocalization.

Quantitative optical oscillator strength spectra for C 1s excitation and ionization of gas-phase biphenyl, decafluorobiphenyl, and 2,2'-bis(bromomethyl)-1,1'-biphenyl have been derived from electron energy loss spectroscopy recorded under electric dipole dominated conditions. The C 1s X-ray absorption spectrum of hexaphenylbenzene has been recorded in the solid state. The C 1s spectral features are interpreted with the aid of ab initio calculations for core excitation of benzene, biphenyl, hexafluorobenzene, and decafluorobiphenyl.