Determination of Stiffness and the Elastic Modulus of 3D-Printed Micropillars with Atomic Force Microscopy-Force Spectroscopy.

Nowadays, many applications in diverse fields are taking advantage of micropillars such as optics, tribology, biology, and biomedical engineering. Among them, one of the most attractive is three-dimensional microelectrode arrays for in vivo and in vitro studies, such as cellular recording, biosensors, and drug delivery. Depending on the application, the micropillar's optimal mechanical response ranges from soft to stiff.

In Situ Force Microscopy to Investigate Fracture in Stretchable Electronics: Insights on Local Surface Mechanics and Conductivity.

Stretchable conductors are of crucial relevance for emerging technologies such as wearable electronics, low-invasive bioelectronic implants, or soft actuators for robotics. A critical issue for their development regards the understanding of defect formation and fracture of conducting pathways during stress-strain cycles. Here we present a combination of atomic force microscopy (AFM) methods that provides multichannel images of surface morphology, conductivity, and elastic modulus during sample deformation.

Atomic Force Microscopy Nanomechanics of Hard Nanometer-Thick Films on Soft Substrates: Insights into Stretchable Conductors.

The nanomechanical properties of ultrathin and nanostructured films of rigid electronic materials on soft substrates are of crucial relevance to realize materials and devices for stretchable electronics. Of particular interest are bending deformations in buckled nanometer-thick films or patterned networks of rigid materials as they can be exploited to compensate for the missing tensile elasticity. Here, we perform atomic force microscopy indentation experiments and electrical measurements to characterize the nanomechanics of ultrathin gold films on a polydimethylsiloxane (PDMS) elastomer.