The combination of complementary measurement techniques has become a frequent approach to improve scientific knowledge. Pairing of the high lateral resolution scanning force microscopy (SFM) with the spectroscopic information accessible through scanning transmission soft x-ray microscopy (STXM) permits assessing physical and chemical material properties with high spatial resolution. We present progress from the NanoXAS instrument towards using an SFM probe as an x-ray detector for STXM measurements.
View Article and Find Full Text PDFMetallic silver, copper, and Ag-Cu nanoparticles (NPs) have been produced by a chemical reduction method. The obtained nanoparticles were characterized by powder X-ray diffraction (XRD) and transmission electron microscopy (TEM). A side-segregated configuration was observed for the one-pot synthesized Ag-Cu NPs, and the melting temperature depression of about 14 °C was found by differential scanning calorimetry (DSC).
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