Publications by authors named "Georges Giakoumakis"

Getting complementary physical information from a single image acquisition is particularly valuable for materials analysis. Grating based X-ray Phase Contrast Imaging (XPCI) methods allow decoupling attenuation, phase and scattering information. However, the phase and scattering extraction processes can easily suffer from artefacts, which is detrimental to implement this imaging technique in societal applications.

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X-ray grating-based techniques often lead to artifacts in the phase retrieval process of phase objects presenting very fast spatial transitions or sudden jumps, especially in the field of non-destructive testing and evaluation. In this paper, we present a method that prevents the emergence of artifacts by building an interferogram corrected from any variations of the object intensity and given as input in the phase retrieval process. For illustration, this method is applied to a carbon fiber specimen imaged by a microfocus X-ray tube and a single 2D grating.

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We present a graphical tool that we call a "confidence map". It allows to evaluate locally the quality of a phase image retrieved from the measurement of its gradients. The tool is primarily used to alert the observer to the presence of artifacts that could affect his interpretation of the image.

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The purpose of this paper is to show that the Shack-Hartmann wavefront sensor (SHWFS) gives access to more derivatives than the two orthogonal derivatives classically extracted either by estimating the centroid or by taking into account the first two harmonics of the Fourier transform. The demonstration is based on a simple model of the SHWFS, taking into account the microlens array as a whole and linking the SHWFS to the multi-lateral shearing interferometry family. This allows for estimating the quality of these additional derivatives, paving the way to new reconstruction techniques involving more than two cross derivatives that should improve the signal-to-noise ratio.

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Synopsis of recent research by authors named "Georges Giakoumakis"

  • - Georges Giakoumakis' recent research focuses on advancing X-ray imaging techniques, particularly in the context of phase contrast imaging to improve material characterization and reduce artifacts, which is crucial for non-destructive testing applications
  • - His work includes the development of methods to minimize artifacts in phase retrieval processes and the introduction of a "confidence map" tool for enhancing the quality assessment of phase images, aiding in the interpretation of the results
  • - Additionally, Giakoumakis has explored the capabilities of Shack-Hartmann wavefront sensors to extract more than the standard two orthogonal derivatives, expanding potential applications in wavefront sensing and imaging improvements aimed at increasing signal clarity