Lowering the Size Detection Limits of Ag and TiO Nanoparticles by Single Particle ICP-MS.

As the production and use of engineered nanomaterials increase, there is an urgent need to develop analytical techniques that are sufficiently sensitive to be able to measure the very small nanoparticles (NP) at very low concentrations. Although single particle ICP-MS (SP-ICP-MS) is emerging as one of the best techniques for detecting NP, it is limited by relatively high size detection limits for several NP, including many of the oxides. The use of a high sensitivity sector field ICP-MS (ICP-SF-MS), microsecond dwell times, and dry aerosol sample introduction systems were examined with the goal of lowering the size detection limits of the technique.