LUT-based phase error compensation method for large-step phase-shifting algorithm in DLP4500-based FPP system.

As a low-cost professional digital light projection device, the DLP4500 have been widely applied in fringe projection profilometry (FPP), for both laboratory and practical application. However, our recent experiments revealed a new hardware-induced projection instability when the projection pattern data exceeds its buffer capacity (48 bits). This phenomenon undermines the measurement accuracy advantage of the phase-shifting (PS) algorithms with large number of shifting steps, and eventually leads unwanted and complicated error to 3D reconstruction.

Control of Tooth Form Deformation in Heat Treatment of Spiral Bevel Gears Based on Reverse Adjustment of Cutting Parameters.

The tooth surface structure of spiral bevel gear is complex and requires high machining accuracy. In order to reduce the tooth form deformation of heat treatment, this paper proposes a reverse adjustment correction model of tooth cutting for heat treatment tooth form deformation of spiral bevel gear. Based on the Levenberg-Marquardat method, a stable and accurate numerical solution for the reverse adjustment amount of the cutting parameters is solved.

Study on the Grooved Morphology of CMC-SiC/SiC by Dual-Beam Coupling Nanosecond Laser.

Due to the excellent properties of high hardness, oxidation resistance, and high-temperature resistance, silicon carbide fiber reinforced silicon carbide ceramic matrix composite (CMC-SiC/SiC) is a typical difficult-to-process material. In this paper, according to the relationship between the spatial posture of dual beams and the direction of the machining path, two kinds of scanning methods were set up. The CMC-SiC/SiC grooving experiments were carried out along different feeding directions (transverse scanning and longitudinal scanning) by using a novel dual-beam coupling nanosecond laser, and the characteristics of grooving morphology were observed by Laser Confocal Microscope, Scanning Electron Microscopy (SEM), and Energy Dispersive Spectrometer (EDS).