Publications by authors named "Gangwar O"

Wheat is one of the most important food crop cultivated across the globe which ensures sustainability and food security to massive world's population, but its production is threatened by both biotic factors like rust (caused by species) and abiotic stresses such as salinity. In this study, 41 salt-tolerant wheat lines were screened for rust resistance at both seedling and adult plant stages. Rust resistance genes were characterized through gene matching technique and molecular markers analysis.

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Article Synopsis
  • - The gene Sr65, found on chromosome 1A of the Indian wheat landrace Hango-2, provides crucial resistance against the stem rust pathogen Puccinia graminis f. sp. tritici (Pgt), protecting wheat crops in multiple regions including Australia, India, Africa, and Europe.
  • - Research on a recombinant line population of Hango-2 discovered two resistance genes: a new gene termed SrH2 and an existing one called Sr26; SrH2 was mapped to a specific region on chromosome 1A and is valuable for developing resistant wheat varieties.
  • - The markers associated with SrH2, KASP_12147 and sunCS_265, show high polymorphism in
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spp. causing rust diseases in wheat and other cereals secrete several specialized effector proteins into host cells. Characterization of these proteins and their interaction with host's R proteins could greatly help to limit crop losses due to diseases.

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Wheat stem rust, caused by f. sp. (), has re-emerged as one of the major concerns for global wheat production since the evolution of Ug99 and other virulent pathotypes of from East Africa, Europe, Central Asia, and other regions.

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Plant diseases threaten global food security by reducing the production and quality of produce. Identification of disease resistance sources and their utilization in crop improvement is of paramount significance. However, constant evolution and occurrence of new, more aggressive and highly virulent pathotypes disintegrates the resistance of cultivars and hence demanding the steady stream of disease resistance cultivars as the most sustainable way of disease management.

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Stripe rust (Sr), caused by Puccinia striiformis f. sp. tritici (Pst), is the most devastating disease that poses serious threat to the wheat-growing nations across the globe.

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The outcome of different host-pathogen interactions is influenced by both genetic and epigenetic systems, which determine the response of plants to pathogens and vice versa. This review highlights key molecular mechanisms and conceptual advances involved in epigenetic research and the progress made in epigenetics of wheat-rust interactions. Epigenetics implies the heritable changes in the way of gene expression as a consequence of the modification of DNA bases, histone proteins, and/or non-coding-RNA biogenesis without disturbing the underlying nucleotide sequence.

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Article Synopsis
  • Systematic surveys of wheat yellow rust in India began in 1930, but there was a lack of data on the genetic diversity and population structure of the pathogen, prompting this study.
  • The study identified two distinct subpopulations of the yellow rust pathogen, showing significant genetic diversity and evidence of asexual (clonal) reproduction, with 102 alleles detected across various pathotypes.
  • Analysis found a moderate level of genetic differentiation and gene flow between subpopulations, as well as a weak positive correlation between the pathogen's virulence phenotypes and its molecular genotypes.
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Wheat is the second most cultivated cereal crop in the world and is an important crop in India. Leaf (brown) rust, caused by , was the most prevalent among the three rusts found in all the wheat-growing areas of India, Bhutan, and Nepal during 2016 to 2019. Leaf rust samples from wheat crops in these countries were pathotyped using the wheat differential genotypes and binomial Indian system of nomenclature.

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A new leaf rust resistance gene Lr80 was identified and closely linked markers were developed for its successful pyramiding with other marker-tagged genes to achieve durable control of leaf rust. Common wheat landrace Hango-2, collected in 2006 from the Himalayan area of Hango, District Kinnaur, in Himachal Pradesh, exhibited a very low infection type (IT;) at the seedling stage to all Indian Puccinia triticina (Pt) pathotypes, except the pathotype 5R9-7 which produced IT 3. Genetic analysis based on Agra Local/Hango-2-derived F families indicated monogenic control of leaf rust resistance, and the underlying locus was temporarily named LrH2.

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Resistance in modern wheat cultivars for stripe rust is not long lasting due to the narrow genetic base and periodical evolution of new pathogenic races. Though nearly 83 genes conferring resistance to stripe rust have been cataloged so far, few of them have been mapped and utilized in breeding programs. Characterization of wheat germplasm for novel sources of resistance and their incorporation into elite cultivars is required to achieve durable resistance and thus to minimize the yield losses.

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Among several important wheat foliar diseases, Stripe rust (YR), Leaf rust (LR), and Stem rust (SR) have always been an issue of concern to the farmers and wheat breeders. Evolution of virulent pathotypes of these rusts has posed frequent threats to an epidemic. Pyramiding rust-resistant genes are the most economical and environment-friendly approach in postponing this inevitable threat.

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Identification and functional characterization of plant pathogen effectors promise to ameliorate future research and develop effective and sustainable strategies for controlling or containing crop diseases. Wheat is the second most important food crop of the world after rice. Rust pathogens, one of the major biotic stresses in wheat production, are capable of threatening the world food security.

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A comprehensive germplasm evaluation study of wheat accessions conserved in the Indian National Genebank was conducted to identify sources of rust and spot blotch resistance. Genebank accessions comprising three species of wheat-Triticum aestivum, T. durum and T.

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