Structural characterization and magnetic response of poly(p-xylylene)-MnSb and MnSb films deposited at cryogenic temperature.

In this study, we employed several experimental techniques to investigate structure and magnetic properties of poly(p-xylylene)-MnSb composites synthesized by low-temperature vapor deposition polymerization technique and MnSb films deposited at various temperatures. The presence of MnSb nanocrystallites in the studied films was verified by the results of X-ray diffraction, electron microscopy and Raman spectroscopy studies. The obtained data revealed the formation of Sb-rich sublayer with well-oriented Sb grains near the susbtrate, which seems to act as a buffer for the consequent poly(p-xylylene)-MnSb or MnSb layer growth.

Europium Silicide - a Prospective Material for Contacts with Silicon.

Metal-silicon junctions are crucial to the operation of semiconductor devices: aggressive scaling demands low-resistive metallic terminals to replace high-doped silicon in transistors. It suggests an efficient charge injection through a low Schottky barrier between a metal and Si. Tremendous efforts invested into engineering metal-silicon junctions reveal the major role of chemical bonding at the interface: premier contacts entail epitaxial integration of metal silicides with Si.