Quantitative characterization of hierarchical multiscale surfaces of micro and nanostructured materials.

Hierarchical surfaces have recently attracted a lot of interest, mainly due to their ability to exhibit multifunctionality combining different properties. However, despite the extensive experimental and technological appeal of hierarchical surfaces, a systematic and thorough quantitative characterization of their features is still missing. The aim of this paper is to fill this gap and build a theoretical framework for the classification, identification and quantitative characterization of hierarchical surfaces.

Impact of Line Edge Roughness on ReRAM Uniformity and Scaling.

We investigate the effects of Line Edge Roughness (LER) of electrode lines on the uniformity of Resistive Random Access Memory (ReRAM) device areas in cross-point architectures. To this end, a modeling approach is implemented based on the generation of 2D cross-point patterns with predefined and controlled LER and pattern parameters. The aim is to evaluate the significance of LER in the variability of device areas and their performances and to pinpoint the most critical parameters and conditions.