Light Res Technol
December 2024
The increasing use of a spatially varying bidirectional reflectance distribution function (svBRDF) to describe the appearance of an object raises the important question of how BRDF values change when measured on a small scale. For this reason, we present a new goniospectrophotometer with the ability to measure the BRDF at the micrometer scale (μBRDF). The instrument produces BRDF measurements with a measurement surface diameter of 31 µm.
View Article and Find Full Text PDFThe application of materials with changing visual properties with lighting and observation directions has found broad utility across diverse industries, from architecture and fashion to automotive and film production. The expanding array of applications and appearance reproduction requirements emphasizes the critical role of material appearance measurement and surface characterization. Such measurements offer twofold benefits in soft proofing and product quality control, reducing errors and material waste while providing objective quality assessment.
View Article and Find Full Text PDFTranslucent materials have the property of reflecting light beyond the illumination point due to subsurface light propagation in the material. These reflectance properties can be characterized using the bidirectional scattering-surface reflectance distribution function (BSSRDF), a radiometric quantity that is a function of spatial, angular, spectral, and polarization parameters. At very small scales, we have observed that Spectralon, a commercial material widely used as a diffuse reflectance calibration standard, can be regarded as translucent.
View Article and Find Full Text PDFIn recent years, there has been a growing interest in the measurements of the bidirectional reflectance distribution function (BRDF) in industry and research and development. However, there is currently no dedicated key comparison to demonstrate the scale conformity. To date, scale conformity has been proved only for classical in-plane geometries, in comparisons between different national metrology institutes (NMIs) and designated institutes (DIs).
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