Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-A information limit.

The ability of electron microscopes to analyze all the atoms in individual nanostructures is limited by lens aberrations. However, recent advances in aberration-correcting electron optics have led to greatly enhanced instrument performance and new techniques of electron microscopy. The development of an ultrastable electron microscope with aberration-correcting optics and a monochromated high-brightness source has significantly improved instrument resolution and contrast.

Two-color facility based on a broadly tunable infrared free-electron laser and a subpicosecond-synchronized 10-fs-Ti:sapphire laser.

Subpicosecond synchronization between a mirror-dispersion-controlled 10-fs Ti:sapphire laser and the Free-Electron Laser for Infrared Experiments has been achieved. The measured intensity cross correlation between the two lasers is consistent with a jitter of only 400 fs rms. The wide and continuous tunability of the free-electron laser (FEL; 4.

Mid-infrared (2.75-6.0-microm) second-harmonic generation in LiInS(2).

Phase-matched second-harmonic generation is obtained in various LiInS(2) crystals by use of the tunable picosecond output of the free-electron laser for infrared experiments (FELIX) as the pump source in the mid-IR range from 2.75 to 6.0 microm.

Single-shot electron-beam bunch length measurements.

We report subpicosecond electro-optic measurements of the length of individual relativistic electron bunches. The longitudinal electron-bunch shape is encoded electro-optically on to the spectrum of a chirped laser pulse. The electron-bunch length is determined by analyzing individual laser-pulse spectra obtained with and without the presence of an electron bunch.