Publications by authors named "Fornasini P"

Extended x-ray absorption fine structure (EXAFS) has been measured at theedge of Sn in SnTe in the temperature range from 5 to 480 K. EXAFS results are consistent with the presence of a local rhombohedral distortion in the full temperature range from 5 to 300 K, even well above the ferroelectric transition temperature, suggesting a partial order-disorder character of the transition. At and above 300 K, the anomalous behaviour of the third and fourth EXAFS cumulants reveals a modification of the anharmonicity of the effective pair potential, possibly connected with the softening of high frequency modes or to the presence of multiple phases.

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Extended x-ray absorption fine structure (EXAFS) at the Cd K edge and diffraction patterns have been measured on CdTe as a function of pressure from 100 kPa (1 bar) to 5 GPa using a cell with nano-polycrystalline diamond anvils and an x-ray focussing scanning spectrometer. Three phases-zincblende (ZB), mixed cinnabar-ZB and rocksalt (RS)-are well distinguished in different pressure intervals. The bond compressibility measured by EXAFS in the ZB phase is slightly smaller than the one measured by diffraction and decreases significantly faster when the pressure increases; the difference is attributed to the effect of relative vibrations perpendicular to the Cd-Te bond.

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Extended X-ray absorption fine structure (EXAFS) is a powerful probe of the distribution of nearest-neighbour distances around selected atomic species. We consider here the effect of vibrational disorder in crystals. The potential of EXAFS for the accurate evaluation of the coefficient of bond thermal expansion and its temperature dependence is discussed, with the aim of stimulating and facilitating the comparison with the results from total scattering experiments.

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The effects of structural and vibrational disorder on the EXAFS signals are parameterized in terms of the Debye Waller (DW) factor. Here the vibrational contribution is addressed, which for most systems can be singled out by studying the temperature dependence of the EXAFS DW factor, which corresponds to a good accuracy to the parallel mean square relative displacement (MSRD) around the inter-atomic equilibrium distance. By comparing the first-shell EXAFS thermal expansion with the crystallographic thermal expansion one can evaluate the perpendicular MSRD.

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The bond thermal expansion is in principle different from the lattice expansion and can be measured by correlation sensitive probes such as extended x-ray absorption fine structure (EXAFS) and diffuse scattering. The temperature dependence of the coefficient α(bond)(T) of bond thermal expansion has been obtained from EXAFS for CdTe and for Cu. A coefficient α(tens)(T) of negative expansion due to tension effects has been calculated from the comparison of bond and lattice expansions.

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Extended X-ray absorption fine structure (EXAFS) has been measured at both the K edges of gallium and arsenic in GaAs, from 14 to 300 K, to investigate the local vibrational and thermodynamic behaviour in terms of bond expansion, parallel, and perpendicular mean square relative displacements and third cumulant. The separate analysis of the two edges allows a self-consistent check of the results and suggests that a residual influence of Ga EXAFS at the As edge cannot be excluded. The relation between bond expansion, lattice expansion, and expansion due to anharmonicity of the effective potential is quantitatively clarified.

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The evaluation of uncertainty in temperature-dependent EXAFS measurements is discussed, considering the specific case of a recent experiment performed on CdTe. EXAFS at both Cd and Te K-edges was measured at different times and at different beamlines in a temperature range from 5 to 300 K. Attention is focused on the nearest-neighbours parameters: bond thermal expansion, parallel and perpendicular mean-square relative displacements and the third cumulant.

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The extended x-ray absorption fine structure (EXAFS) has been measured at both the K edges of cadmium and tellurium in CdTe, from liquid helium to room temperature, in order to investigate the local thermodynamic behaviour. The temperature dependences of the structural parameters obtained from the separate analysis of the two edges are perfectly consistent. The positive contribution to the thermal expansion due to the bond stretching and the negative contribution due to the tension effects are disentangled and quantified in terms of the bond thermal expansion and the perpendicular mean square relative displacement.

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Cu K-edge x-ray absorption near-edge structure (XANES) spectra of trigonal (3R) CuScO(2) and CuLaO(2) and of hexagonal (2H) CuScO(2) were investigated experimentally and theoretically, in order to study differences between spectra of isostructural and isoelectronic compounds. Significant differences were found in the Cu K-edge XANES of 3R CuScO(2) and 3R CuLaO(2); these differences can be understood by considering the calculated polarization dependence of the XANES spectra and the differences between the phaseshifts of Sc and La. Spectra of the 3R and 2H polytypes of CuScO(2) differ only weakly and the difference originates from the long-range order.

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A large number of AgI-based fast-ion-conducting glasses have been investigated by K-iodine extended x-ray absorption fine structure spectroscopy (EXAFS) measurements at liquid nitrogen temperature. A general correlation between the I-Ag distance measured by EXAFS and the glass activation energy for dc ionic conductivity has been found out: glasses with longer I-Ag distances display higher ionic conductivity, independently from the chemical composition of their host glassy matrix. This behavior can be related to the progressive increase of the "pathway volume" for ionic conduction.

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Extended x-ray absorption fine structure has been measured on two powdered samples of (70)Ge and (76)Ge as a function of temperature from 20 to 300 K. The effect of isotopic mass difference on the amplitude of relative atomic vibrations is neatly evidenced by the temperature dependence of the difference of Debye-Waller factors. The isotopic effect is also detected on the difference of nearest-neighbor average ineratomic distances, thanks to a resolution better than 10 fm.

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The correlated Einstein and Debye models for EXAFS parallel mean-square relative displacement (MSRD) are derived from the general expression in terms of eigenfrequencies and eigenvectors of the dynamical matrix, without ad hoc assumptions. The two models are generalized to parameterize also the EXAFS perpendicular MSRD. The physical meaning of Einstein frequencies, as well as the application of the Debye model to crystals with more than one atom per cell, are critically discussed.

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The local thermal behavior of the Ag(2)O framework structure has been studied by extended x-ray absorption fine structure. The average Ag-O nearest-neighbor distance expands upon heating, while the Ag-Ag next-nearest-neighbor distance contracts. An original implementation of the cumulant analysis shows that the Ag-O expansion is a joint effect of potential anharmonicity and geometrical deformation of the Ag(4)O basic tetrahedral units.

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The analysis of temperature-dependent EXAFS spectra based on the cumulant expansion is critically reviewed, seeking for accurate relations between EXAFS parameters and physical properties of crystals. The treatment is based on the distinction between the real and effective distribution of distances, and is divided into three logical steps. (a) The connection between lattice dynamics and cumulants C(n)* of the real distribution is studied and the extent of the usual approximations are numerically evaluated.

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The EXAFS Debye-Waller factor depends on the correlation of atomic motion and can yield original information on the vibrational dynamics of crystalline solids. In this paper an introductory treatment of thermal disorder in EXAFS, based on thc cumulant approach, is given. Thc general relation between mean-square relative displacement (MSRD) measured by EXAFS and atomic thermal vibrations in harmonic approximation is explored.

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The properties of PIN silicon diodes as X-ray detectors for EXAFS measurements with synchrotron radiation have been investigated. Electronic stability, linearity and noise current have been analyzed. The effects of diffraction peaks resulting from the crystalline nature of the diodes have been minimized by mounting the diodes on a simple device that continuously changes its orientation by a few degrees with respect to the X-ray beam.

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