Selective plane illumination microscope dedicated to volumetric imaging in microfluidic chambers.

In this article, we are presenting an original selective plane illumination fluorescence microscope dedicated to image "Organ-on-chip"-like biostructures in microfluidic chips. In order to be able to morphologically analyze volumetric samples in development at the cellular scale inside microfluidic chambers, the setup presents a compromise between relatively large field of view (∼ 200 µm) and moderate resolution (∼ 5 µm). The microscope is based on a simple design, built around the chip and its microfluidic environment to allow 3D imaging inside the chip.

Sub-wavelength terahertz imaging through optical rectification.

We record a sub-wavelength terahertz image of a caster sugar grain thanks to optical rectification in the sample excited with a femtosecond laser beam. The lateral spatial resolution of this technique is given by the laser spot size at the sample and here its measured value is 50 μm, i.e.

Full electro-optic terahertz time-domain spectrometer for polarimetric studies.

We present a terahertz (THz) time-domain spectrometer dedicated to polarimetric studies. THz pulses are generated through optical rectification in a ⟨111⟩-cut cubic crystal. The ⟨111⟩ crystal cut produces a THz polarization state similar to that of the exciting laser beam.

Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement.

A processing technique for the determination of the average refractive index and thickness of a two-layer system is presented. It is based on a single measurement with a standard terahertz time-domain spectrometer and the multilayer system thickness. The technique relies on the interference caused by the main pulse with the echoes produced in each material.

Birefringence measurement in the terahertz range based on double Fourier analysis.

A method for obtaining the average refractive indexes of a birefringent material in the terahertz region in a single measurement with a standard terahertz time-domain spectrometer is presented. The method is based on processing the frequency-domain interference between terahertz pulses and echoes through the Fourier transform of the terahertz spectrum. The technique also allows the determination of the optical axis orientation of the material by making two measurements with different angles of the sample optical axis.