Sequential and automatic image-sequence registration of road areas monitored from a hovering helicopter.

In this paper, we propose an automatic and sequential method for the registration of an image sequence of a road area without ignoring scene-induced motion. This method contributes to a larger work, aiming at vehicle tracking. A typical image sequence is recorded from a helicopter hovering above the freeway.

Non-rigid image registration to reduce beam-induced blurring of cryo-electron microscopy images.

The typical dose used to record cryo-electron microscopy images from vitrified biological specimens is so high that radiation-induced structural alterations are bound to occur during data acquisition. Integration of all scattered electrons into one image can lead to significant blurring, particularly if the data are collected from an unsupported thin layer of ice suspended over the holes of a support film. Here, the dose has been fractioned and exposure series have been acquired in order to study beam-induced specimen movements under low dose conditions, prior to bubbling.

Defocus estimation from stroboscopic cryo-electron microscopy data.

Defocus estimation is an important step for improving the resolution of single particle reconstructions. It can be troublesome to estimate the defocus from low-dose cryo-electron microscopy (cryo-EM) data, particularly if there is not sufficient contrast present in the Fourier transform of the micrograph. Most existing approaches estimate the defocus from the presence of Thon rings within the power spectrum, employing image enhancement techniques to highlight these rings.

Radiation damage in single-particle cryo-electron microscopy: effects of dose and dose rate.

Radiation damage is an important resolution limiting factor both in macromolecular X-ray crystallography and cryo-electron microscopy. Systematic studies in macromolecular X-ray crystallography greatly benefited from the use of dose, expressed as energy deposited per mass unit, which is derived from parameters including incident flux, beam energy, beam size, sample composition and sample size. In here, the use of dose is reintroduced for electron microscopy, accounting for the electron energy, incident flux and measured sample thickness and composition.