Defects in printed circuit boards (PCBs) occurring during the production process of consumer electronic products can have a substantial impact on product quality, compromising both stability and reliability. Despite considerable efforts in PCB defect inspection, current detection models struggle with accuracy due to complex backgrounds and multi-scale characteristics of PCB defects. This article introduces a novel network, YOLOv8-DSC-EMA-EIoU (YOLOv8-DEE), to address these challenges by enhancing the YOLOv8-L model.
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