ITO thin films have been prepared by electron beam evaporation at oblique angles (OA), directly and while assisting their growth with a downstream plasma. The films microstructure, characterized by scanning electron microscopy, atomic force microscopy, and glancing incidence small-angle X-ray scattering, consisted of tilted and separated nanostructures. In the plasma assisted films, the tilting angle decreased and the nanocolumns became associated in the form of bundles along the direction perpendicular to the flux of evaporated material.
View Article and Find Full Text PDFWe present a straightforward procedure of self-surface patterning with potential applications as large area gratings, invisible labeling, optomechanical transducers, or smart windows. The methodology is based in the formation of parallel micrometric crack patterns when polydimethylsiloxane foils coated with tilted nanocolumnar SiO2 thin films are manually bent. The SiO2 thin films are grown by glancing angle deposition at room temperature.
View Article and Find Full Text PDFSilver nanoparticles (NPs) depicting well defined surface plasmon resonance (SPR) absorption were deposited on flat substrates by physical vapor deposition in a glancing angle configuration. The particles were characterized by scanning electron microscopy and atomic force microscopy and their optical properties examined by UV-vis absorption spectroscopy using linearly polarized light. It was found that, depending on the amount of deposited silver and the evaporation angle, part of the 'as-prepared' samples present NPs characterized by an anisotropic shape and a polarization dependent SPR absorption and different colors when using polarized white light at 0° and 90°.
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