Direct and Indirect Selection for Grain Yield and Grain Weight in Late Generations of Bread Wheat under Drought Stress and Normal Irrigation Environments.

Two cycles of pedigree selection for grain yield/plant (GY/P) and grain weight (GW) (100-grain weight) were imposed under drought stress and normal irrigation to study the direct and indirect selection of GY/P and GW in bread wheat. The selection started in the F-generation (Cycle-C) of bread wheat ( L.) traced back to the cross () of two Egyptian cultivars.

Improving Sesame ( L.) Seed Yield through Selection under Infection of f. sp. .

Sesame ( L.), the Queen of oilseeds, is infected with different pathogens, restricting its yield. f.

Molecular marker dissection of stem rust resistance in Nebraska bread wheat germplasm.

Stem rust (caused by Puccinia graminis f. sp. tritici) is a major disease of wheat.

Genetic architecture of common bunt resistance in winter wheat using genome-wide association study.

Background: Common bunt (caused by Tilletia caries and T. foetida) has been considered as a major disease in wheat (Triticum aestivum) following rust (Puccinia spp.) in the Near East and is economically important in the Great Plains, USA.

Genome-Wide Association Study for Identification and Validation of Novel SNP Markers for Stem Rust Resistance Gene in Bread Wheat.

Unlabelled: Stem rust (caused by f. sp. Erikss.