Determination of the capacitance of solid-state potentiometric sensors: An electrochemical time-of-flight method.

A dual microelectrode electrochemical time-of-flight technique in which diffusion flux of Ag+, Cl-, or H+ ions electrochemically produced at a generator electrode is measured by recording potential-time transients with Ag, Ag/AgCl, or iridium oxide potentiometric microsensors, respectively, is developed. The generator and microsensor electrodes are typically spaced by 50-100 microm and are incorporated in the lithographically fabricated thin-layer-type devices. Under conditions of moderate rates of the ion electrogeneration, the potential-time (E-t) transients recorded with the three microsensors show excellent agreement with theory involving linear diffusion equations and the experimentally determined Nernstian slopes of the microsensors.