Effects of energy spread on brightness and coherence of undulator sources.

The (spectral) brightness for partially transverse coherent sources such as synchrotron radiation and free-electron laser sources can be defined as the maximum of the Wigner distribution. Then, the brightness includes information on both coherence and wavefront characteristics of the radiation field. For undulator sources, it is customary to approximate the single-electron electric field at resonance with a Gaussian beam, leading to great simplifications.

Ultra-high-resolution inelastic X-ray scattering at high-repetition-rate self-seeded X-ray free-electron lasers.

Inelastic X-ray scattering (IXS) is an important tool for studies of equilibrium dynamics in condensed matter. A new spectrometer recently proposed for ultra-high-resolution IXS (UHRIX) has achieved 0.6 meV and 0.

Perspectives for imaging single protein molecules with the present design of the European XFEL.

The Single Particles, Clusters and Biomolecules & Serial Femtosecond Crystallography (SPB/SFX) instrument at the European XFEL is located behind the SASE1 undulator and aims to support imaging and structure determination of biological specimen between about 0.1 μm and 1 μm size. The instrument is designed to work at photon energies from 3 keV up to 16 keV.

Brightness of synchrotron radiation from undulators and bending magnets.

The maximum of the Wigner distribution (WD) of synchrotron radiation (SR) fields is considered as a possible definition of SR source brightness. Such a figure of merit was originally introduced in the SR community by Kim [(1986), Nucl. Instrum.