Publications by authors named "Etsuo Kawate"
Article Synopsis
- A new symmetry X system has been developed for accurately measuring the reflectance and transmittance of surfaces in the infrared spectrum, designed for integration with commercial Fourier-transform infrared spectrometers.
- Despite using ten mirrors in its setup, the system's findings show that the average reflectance can be calculated without needing to consider each mirror's individual characteristics or losses.
- The system not only provides high-accuracy measurements quickly but also allows for self-checking of results and the ability to conduct simultaneous reflectance and transmittance measurements, which enhances the understanding of measurement uncertainties; its design is applicable for various wavelengths beyond infrared.
