Ecotoxicol Environ Saf
January 2021
Radon gas is noble gas formed from the normal radioactive decay series of 238U. Uranium is present in almost all rocks but enriched in silica-rich rocks like granites, gneisses, schists, volcanics, pegmatites, migmatites. The study area extends over metamorphic, volcanic, and clastic sedimentary rocks.
View Article and Find Full Text PDFA mural excavated at the Neolithic Çatalhöyük site (Central Anatolia, Turkey) has been interpreted as the oldest known map. Dating to ∼6600 BCE, it putatively depicts an explosive summit eruption of the Hasan Dağı twin-peaks volcano located ∼130 km northeast of Çatalhöyük, and a birds-eye view of a town plan in the foreground. This interpretation, however, has remained controversial not least because independent evidence for a contemporaneous explosive volcanic eruption of Hasan Dağı has been lacking.
View Article and Find Full Text PDFBackground: Preservation of fossil vertebrates in volcanic rocks is extremely rare. An articulated skull (cranium and mandible) of a rhinoceros was found in a 9.2±0.
View Article and Find Full Text PDFThe depth-of-field mainly affects the image quality either in scanning electron microscopy (SEM) or conventional light microscopy. The limited depth-of-field handicap of microscopy imaging can be used for obtaining "optically sectioned" specimens by moving the object along the optical axis. In this study, multiple images corresponding to different object planes were taken in order to overcome limited depth-of-field on conventional light microscope and SEM, estimation of an elevation surface and 3D reconstruction of different type volcanic ash surfaces.
View Article and Find Full Text PDFElectron probe microanalysis (EPMA) is an essential analytical approach to determine elemental concentrations of various solid specimens quantitatively in mineralogical, petrological and materials research. Either wavelength dispersive X-ray (WDS) or energy dispersive X-ray (EDS) spectrometric techniques can collect the characteristic X-rays generated from each element in the specimen by an incident electron beam in order to define chemical constituents. Although WDS has been the preferred technique because of its higher spectral resolution and ability to detect trace elements, new generation EDS systems with silicon drift detectors (SDD), equipped with thin windows and integrated digital processing electronics, are claimed to approach the WDS throughput.
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