Publications by authors named "Enrico Fumagalli"
Grazing-incidence X-ray diffraction study of rubrene epitaxial thin films.
J Synchrotron Radiat
September 2012
Article Synopsis
- - The advancement of organic semiconductors as thin films is crucial for enhancing their electrical performance in electronic devices.
- - Grazing-incidence X-ray diffraction was used to analyze rubrene thin films deposited on tetracene single crystals, confirming their orthorhombic structure and alignment.
- - The study identifies a specific epitaxial relationship between the rubrene film and the tetracene substrate, showing a consistent in-plane orientation of the film.