A Simple Approach for Thickness Measurements Using Electron Probe Microanalysis.

A simple and fast method for thickness measurements using electron probe microanalysis (EPMA) is described. The method is applicable on samples with a thickness smaller than the electron depth range and does not require any knowledge of instrumental parameters. The thickness is determined by means of the distance that electrons travel inside the sample before crossing through it.

Characterization of the Chemical Composition of Uranium Microparticles with Irregular Shapes Using Standardless Electron Probe Microanalysis and Micro-Raman Spectrometry.

We describe an approach enabling the identification of the elemental composition of uranium microparticles with undefined geometry using standardless quantitative electron probe microanalysis (EPMA) and micro-Raman spectrometry (MRS). The standardless procedure is based on a ZAF peak-to-background quantitative method in combination with Monte Carlo simulations. The experimental X-ray spectra were measured with an energy-dispersive spectrometer attached to a scanning electron microscope.