Publications by authors named "Ekaterina Endiiarova"

Article Synopsis
  • - The traditional methods for making colloidal crystals struggle to achieve the necessary conditions of uniform thickness, 3D ordering, and large defect-free areas, which are essential for creating photonic structures with tunable properties.
  • - A new approach using the Langmuir-Blodgett process and spin-coating has been developed, enabling the formation of high-quality 3D colloidal crystals with minimal defects.
  • - This innovative technique resulted in polystyrene colloidal crystals that covered about 96.5% of the substrate and showed strong 3D ordering, as evidenced by specific optical properties related to Bragg diffraction.
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The possibility of using colloidal lithography at the industrial level depends on the ability to form defect-free coatings over large areas. The spin-coating method has not yet shown acceptable results, but a more detailed studying of the regularities of this process may improve the quality of masks. The Langmuir-Blodgett method is expected to be the most preferable for forming high-quality large-scale monolayers.

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This work is devoted to the development of nanosphere lithography (NSL) technology, which is a low-cost and efficient method to form nanostructures for nanoelectronics, as well as optoelectronic, plasmonic and photovoltaic applications. Creating a nanosphere mask by spin-coating is a promising, but not sufficiently studied method, requiring a large experimental base for different sizes of nanospheres. So, in this work, we investigated the influence of the technological parameters of NSL by spin-coating on the substrate coverage area by a monolayer of nanospheres with a diameter of 300 nm.

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In this work, we demonstrate the high efficiency of optical emission spectroscopy to estimate the etching profile of silicon structures in SF/CF/O plasma. The etching profile is evaluated as a ratio of the emission intensity of the oxygen line (778.1 nm) to the fluorine lines (685.

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In this work, we demonstrate an effective way of deep (30 µm depth), highly oriented (90° sidewall angle) structures formation with sub-nanometer surface roughness (R = 0.7 nm) in silicon carbide (SiC). These structures were obtained by dry etching in SF/O inductively coupled plasma (ICP) at increased substrate holder temperatures.

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