Single-phase epitaxial HfZrO films with non-centrosymmetric orthorhombic structure have been grown directly on electrode-free corundum (α-AlO) substrates by pulsed laser deposition. A combination of high-resolution X-ray diffraction and X-ray absorption spectroscopy confirms the epitaxial growth of high-quality films belonging to the 2 space group, with [111] out-of-plane orientation. The surface of a 7-nm-thick sample exhibits an atomic step-terrace structure with a corrugation of the order of one atomic layer, as proved by atomic force microscopy.
View Article and Find Full Text PDFBackground: The aim of this study was to evaluate obturation depth and volume by means of micro-CT when filling lateral canals.
Material And Methods: Thirty single-rooted teeth were used. After instrumentation, three artificial lateral canals were created on each mesial and distal surface (one on each third).