Rocking curve topography at the Advanced Photon Source's beamline 1-BM measures the x-ray reflection from large (many cm) flat crystals on a sub-mm scale with microradian angular resolution. The (011̄1) reflection at 8 keV is uniform across the crystal and close to theory for three thick quartz wafers well-polished with increasingly finer grit. However, the reflection is non-uniform for some ∼0.
View Article and Find Full Text PDFBent crystals used in diagnostics of plasmas combine x-rays diffracted from across the crystal. Therefore imperfections in the resulting 1-D spectrum or 2-D image are not the best way to find out why one particular crystal may differ in its performance from another and what, if anything, to do about it. Instead, here we want to measure the diffraction locally, with the necessary resolution.
View Article and Find Full Text PDFA high spatial resolution of a few μm is often required for probing small-scale high-energy-density plasmas using high resolution x-ray imaging spectroscopy. This resolution can be achieved by adjusting system magnification to overcome the inherent limitation of the detector pixel size. Laboratory experiments on investigating the relation between spatial resolution and system magnification for a spherical crystal spectrometer are presented.
View Article and Find Full Text PDFThe quality of x-ray spectra and images obtained from plasmas with spherically bent crystals depends in part on the crystal's x-ray diffraction across the entire crystal surface. We employ the energy selectivity and high intensity of synchrotron radiation to examine typical spherical crystals from alpha-quartz for their diffraction quality, in a perpendicular geometry that is particularly convenient to examine sagittal focusing. The crystal's local diffraction is not ideal: the most noticeable problems come from isolated regions that so far have failed to correlate with visible imperfections.
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