Rocking curve topography at the Advanced Photon Source's beamline 1-BM measures the x-ray reflection from large (many cm) flat crystals on a sub-mm scale with microradian angular resolution. The (011̄1) reflection at 8 keV is uniform across the crystal and close to theory for three thick quartz wafers well-polished with increasingly finer grit. However, the reflection is non-uniform for some ∼0.
View Article and Find Full Text PDFThe IRIXS Spectrograph represents a new design of an ultra-high-resolution resonant inelastic X-ray scattering (RIXS) spectrometer that operates at the Ru L-edge (2840 eV). First proposed in the field of hard X-rays by Shvyd'ko [(2015), Phys. Rev.
View Article and Find Full Text PDFJ Synchrotron Radiat
November 2020
The results are reported of an X-ray diffraction study of an Si crystal designed and fabricated for very asymmetric diffraction from the 333 reflection for X-ray energies of 8.100 and 8.200 keV.
View Article and Find Full Text PDFA novel diced spherical quartz analyzer for use in resonant inelastic X-ray scattering (RIXS) is introduced, achieving an unprecedented energy resolution of 10.53 meV at the Ir L absorption edge (11.215 keV).
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