Publications by authors named "Dominik Badura"
Article Synopsis
- Focused electron beam-induced deposition (FEBID) is a cutting-edge method for creating complex nanostructures, particularly those that can stand independently.
- Measuring the properties of these free-standing nanostructures is challenging due to potential interference from the measurement equipment.
- The paper introduces operational micro-electromechanical system (opMEMS) bridges, which are advanced 3D structures that allow for accurate measurement of these nanostructures' properties, such as resistance, without interference.
One of the most advanced and versatile nanoscale diagnostic tools is atomic force microscopy. By enabling advanced imaging techniques, it allows us to determine various assets of a surface, including morphological, electrical, mechanical, magnetic, and thermal properties. Measuring local current flow is one of the very important methods of evaluation for, for instance, photovoltaic materials or semiconductor structures and other nanodevices.
View Article and Find Full Text PDFThis paper presents the possibilities of applying atomic force microscopy (AFM) techniques to the study of the wear of prosthetic biomaterials. In the conducted research, a zirconium oxide sphere was used as a test piece for mashing, which was moved over the surface of selected biomaterials: polyether ether ketone (PEEK) and dental gold alloy (Degulor M). The process was carried out with constant load force in an artificial saliva environment (Mucinox).
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