Publications by authors named "Dian Bian"

Standard beams are mainly used for the calibration of strain sensors using their load reconstruction models. However, as an ill-posed inverse problem, the solution to these models often fails to converge, especially when dealing with dynamic loads of different frequencies. To overcome this problem, a piecewise Tikhonov regularization method (PTR) is proposed to reconstruct dynamic loads.

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We propose a radial shearing interferometric approach to measure spherical wavefronts as both of the reflective and transmissive optical configurations. The modified cyclic radial shearing interferometer uses a single lens in the optical layout, which can conveniently adjust the radial shearing ratio between two shearing spherical wavefronts, and the use of a polarization camera enables to reconstruct the wavefront by a single image. The wavefront mapped onto the camera plane can be identified and quantified throughout an optimized wavefront reconstruction algorithm.

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In the fields of satellite formation, large-scale manufacturing, and ultra-precision machining, high-precision ranging based on the femtosecond laser is one of the necessary technologies. However, the fluctuations of the air refractive index and the limited tuning range of repetition rate restrict the measurement precision and range. Using only one femtosecond comb that corrects the air refractive index simultaneously, a method for ranging without the dead zone of measurement is described.

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In this investigation, we describe a simple cyclic radial shearing interferometer for single-shot wavefront sensing. Instead of using the telescope lens system used in typical radial shearing interferometry, a single lens is used to generate two diverging radial shearing beams. This simple modification leads to the advantages of conveniently adjusting the radial shearing ratio, compactness of the system, and practical ease of alignment.

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A scanning interferometry system based on near-infrared low-coherence interferometry by using a superluminescent diode (SLD) as the light source is presented. The system cannot only measure the surface profile of doped double-sided polished silicon but also measure its optical thickness and refractive index. The measurement system uses near-infrared CCD to detect interferometric light in the near infrared, based on the Michelson interference principle.

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