Mapping of Genetic Loci Conferring Resistance to Leaf Rust From Three Globally Resistant Durum Wheat Sources.

Genetic resistance in the host plant is the most economical and environmentally friendly strategy for controlling wheat leaf rust, caused by Eriks. The durum wheat lines Gaza (Middle East), Arnacoris (France) and Saragolla (Italy) express high levels of resistance to the Mexican races of . Three recombinant inbred line (RIL) populations, derived from crosses of each of these resistance sources to the susceptible line ATRED #2, were evaluated for leaf rust reactions at CIMMYT's leaf rust nurseries in Mexico.

Characterization and mapping of leaf rust resistance in four durum wheat cultivars.

Widening the genetic basis of leaf rust resistance is a primary objective of the global durum wheat breeding effort at the International Wheat and Maize Improvement Center (CIMMYT). Breeding programs in North America are following suit, especially after the emergence of new races of Puccinia triticina such as BBG/BP and BBBQD in Mexico and the United States, respectively. This study was conducted to characterize and map previously undescribed genes for leaf rust resistance in durum wheat and to develop reliable molecular markers for marker-assisted breeding.

Genetic analysis of leaf rust resistance in six durum wheat genotypes.

Leaf rust, caused by Puccinia triticina, is one of the main fungal diseases limiting durum wheat production. This study aimed to characterize previously undescribed genes for leaf rust resistance in durum wheat. Six different resistant durum genotypes were crossed to two susceptible International Maize and Wheat Improvement Center (CIMMYT) lines and the resulting F1, F2, and F3 progenies were evaluated for leaf rust reactions in the field and under greenhouse conditions.