Stochastically structured illumination microscopy scan less super resolution imaging.

In super-resolution, a varying illumination image stack is required. This enriched dataset typically necessitates precise mechanical control and micron-scale optical alignment and repeatability. Here, we introduce a novel methodology for super-resolution microscopy called stochastically structured illumination microscopy (SIM), which bypasses the need for illumination control exploiting instead the random, uncontrolled movement of the target object.