Current-voltage characteristics and electroresistance in LaMnO/LaCaMnO/LaAlO thin film composites.

In this communication, we report results of the electrical transport properties across the interface of composites consisting of n-type LaMnO (LMO) and p-type LaCaMnO (LCMO) manganites grown on LaAlO (LAO) single crystalline substrates using low cost wet chemical solution deposition (CSD) and sophisticated, well-controlled dry chemical vapor deposition (CVD) chemical techniques. The XRD ϕ-scan studies reveal the single crystalline nature of both bilayered composites, with parallel epitaxial growth of LMO and LCMO layers onto the LAO substrate. The valence states of Mn ions in both layers of both composites were identified by performing X-ray photoelectron spectroscopy (XPS).

Transport properties and electroresistance of a manganite based heterostructure: role of the manganite-manganite interface.

In this paper, we report the results of the investigations on the transport properties performed across the manganite-manganite interface in the LaMnO3-δ/La0.7Ca0.3MnO3/LaAlO3 (LMO/LCMO/LAO) heterostructure.