Publications by authors named "David Navajas"
Article Synopsis
- Epsilon-near-zero (ENZ) materials are being studied for their unique wave properties and enhanced nonlinear responses, which have significant technological implications.
- This research examines how surface roughness affects ENZ substrates by using silicon carbide (SiC) with varying roughness levels, from a few to hundreds of nanometers.
- Findings reveal that roughness in the nanometer range can disrupt the performance of ENZ substrates, while roughness in the hundreds of nanometers range actually improves the stability of ENZ bands compared to other types of polariton bands.
Radiative thermal engineering with subwavelength metallic bodies is a key element for heat and energy management applications, communication and sensing. Here, we numerically and experimentally demonstrate metallic thermal emitters with narrowband but extremely stable emission spectra, whose resonant frequency does not shift with changes on the nanofilm thickness, the angle of observation and/or polarization. Our devices are based on epsilon-near-zero (ENZ) substrates acting as material-based high-impedance substrates.
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