Detection of sub-10 nm emission profile features in organic light-emitting diodes using destructive interference.

The position of light-emitting molecules can be identified using interferometric approaches. Standard schemes utilize constructive interference to obtain a sectioned area of interest with high detection efficiency. The examination of organic light-emitting diodes (OLED) removes the common constraint of low light levels and enables a more generalized analysis.

Extraction of surface plasmons in organic light-emitting diodes via high-index coupling.

The efficiency of organic light-emitting diodes (OLEDs) is still limited by poor light outcoupling. In particular, the excitation of surface plasmon polaritons (SPPs) at metal-organic interfaces represents a major loss channel. By combining optical simulations and experiments on simplified luminescent thin-film structures we elaborate the conditions for the extraction of SPPs via coupling to high-index media.