Determining the orientations of ice crystals using electron backscatter patterns.

Knowing the orientations of the ice crystals in a polycrystalline aggregate is essential for understanding and modeling the flow of naturally occurring ice. Here we show, for the first time, that the orientation of crystals in polycrystalline ice can be determined with a higher angular and spatial resolution and more rapidly than any currently used method by using electron backscatter patterns (EBSPs) in a cold-stage equipped scanning electron microscope. We also present an orientation image map constructed from EBSPs, and discuss possible applications of the technique for ice.

SEM/EDS comparison of polar and seasonal temperate ice.

We have developed a method employing a scanning electron microscope (SEM) and energy dispersive X-ray spectroscopy for examining uncoated ice specimens. By permitting the ice to sublimate in the SEM at temperatures between -115 degrees and -60 degrees C, enough ions are produced to prevent specimen charging. The absence of a conductive coating permits both the acquisition of uncompromised X-ray spectra, and a dynamic view of impurities as the ice sublimates.