Author Correction: Spectrally filtered passive Si photodiode array for on-chip fluorescence imaging of intracellular calcium dynamics.

An amendment to this paper has been published and can be accessed via a link at the top of the paper.

Single-Cell Optogenetic Control of Calcium Signaling with a High-Density Micro-LED Array.

Precise optogenetic control, ideally down to single cells in dense cell populations, is essential in understanding the heterogeneity of cell networks. Devices with such capability, if built in a chip scale, will advance optogenetic studies at cellular levels in a variety of experimental settings. Here we demonstrate optogenetic control of intracellular Ca dynamics at the single cell level using a 16-μm pitched micro-light emitting diode (LED) array that features high brightness, small spot size, fast response, and low voltage operation.

Spectrally filtered passive Si photodiode array for on-chip fluorescence imaging of intracellular calcium dynamics.

On-chip fluorescence imaging devices are recognized for their miniaturized and implantable nature that can benefit the study of intracellular dynamics at a variety of settings. However, it is challenging to integrate a spectral filter onto such devices (to block the excitation light) that has similar performance to the state-of-the-art emission filters used in fluorescence microscopes. In this work, we report a 100%-yield, spectrally filtered passive Si photodiode array designed for on-chip fluorescence imaging of intracellular Ca dynamics.

Carrier-Number-Fluctuation Induced Ultralow 1/f Noise Level in Top-Gated Graphene Field Effect Transistor.

A top-gated graphene FET with an ultralow 1/f noise level of 1.8 × 10 μmHz (f = 10 Hz) has been fabricated. The noise has the least value at Dirac point, it then increases fast when the current deviates from that at Dirac point, the noise slightly decreases at large current.

A more reliable measurement method for metal/graphene contact resistance.

The contact resistance of metal/graphene is becoming a major limiting factor for graphene devices. Among various kinds of contact resistance test methods, the transmission line model is the most common approach to extract contact resistance in graphene devices. However, experiments show that in some cases there exists large inaccuracy and instability using this method.