Localized surface curvature artifacts in tip-enhanced nanospectroscopy imaging.

Tip-enhanced Raman spectroscopy (TERS) allows the chemical analysis with a spatial resolution at the nanoscale, well beyond what the diffraction limit of light makes possible. We can further boost the TERS sensitivity by using a metallic substrate in the so-called gap-mode TERS. In this context, the goal of this work is to provide a generalized view of imaging artifacts in TERS and near-field imaging that occur due to tip-sample coupling.