Publications by authors named "Craig Y Nakakura"
Article Synopsis
- Scanning electron microscopy (SEM) has been widely used for imaging nanostructures, but traditional detectors often miss valuable information from secondary electrons.
- By modifying standard SEM tools, researchers can capture detailed momentum and energy data from secondary electrons, enabling them to visualize electric fields in silicon p-n junctions and differentiate doped regions buried beneath the surface.
- This new approach reveals significant insights into surface band bending in semiconductor structures, enhancing our understanding of complex electronic components crucial for modern manufacturing.
