We have investigated ferroelectric charged domains in polycrystalline hexagonal yttrium manganite thin films (YMnO, YMnO, YMnTiO, and YMnTiO) by scanning electron microscopy (SEM) in secondary electron emission mode with a small acceleration voltage. Using SEM at an acceleration voltage of 1.0 kV otherwise homogenous surface charging effects are reduced, polarization charges can be observed and polarization directions (±P) of the ferroelectric domains in the polycrystalline thin films can be identified.
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