Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering.

Resonant Inelastic X-ray Scattering (RIXS) is a powerful probe for studying electronic excitations in materials. Standard high energy RIXS measurements do not measure the polarization of the scattered x-rays, which is unfortunate since it carries information about the nature and symmetry of the excitations involved in the scattering process. Here we report the fabrication of thin Si-based polarization analyzers with a double-concave toroidal surface, useful for L-edge RIXS studies in heavier atoms such as the 5-d transition metals.

Development of a graphite polarization analyzer for resonant inelastic x-ray scattering.

Resonant inelastic x-ray scattering (RIXS) is a powerful technique for studying electronic excitations in correlated electron systems. Current RIXS spectrometers measure the changes in energy and momentum of the photons scattered by the sample. A powerful extension of the RIXS technique is the measurement of the polarization state of the scattered photons which contains information about the symmetry of the excitations.