Calculation of the half life for the thermoluminescent signal of Beryllium oxide.

Half-life is one of the fundamental parameters to characterize the thermoluminescent (TL) response in ionizing radiation dosimetry. In general, there are two types of important half-lives to model the phenomenon of thermoluminescence (TL). The first type of half-life is the time required for the concentration of trapped charge carriers in a single trap to decrease to half its initial value; this type of half-life is generally denoted as τ.

Determination of the kinetic parameters of BeO using isothermal decay method.

Most of the existing methods for obtaining the frequency factors make use of the trap depth (activation energy) making some assumptions about the order of the kinetics. This causes inconsistencies in the reported values of trapping parameters due that the values of the activation energy obtained by different methods differ appreciably among them. Then, it is necessary to use a method independent of the trap depth making use of the isothermal luminescence decay (ILD) method.