Publications by authors named "Chun Zun"
Article Synopsis
- Strong electromagnetic and heat stress can severely damage solid insulation materials, which affects power equipment and electronics, but understanding this failure mechanism has been challenging due to a lack of imaging methods.* -
- This study introduces a laser confocal imaging technique that utilizes a newly discovered fluorescence phenomenon to achieve 3D in situ imaging of electrical damage channels in silicone gel, allowing for a better understanding of insulation failure.* -
- The research also proposes a spatial equivalent calculation model to analyze the 3D features of electrical trees and leverages molecular dynamics simulations to study insulation failure caused by varying electric field frequencies, paving the way for improved material analysis and defect diagnosis.*