Publications by authors named "Christopher Jezewski"

Article Synopsis
  • The study examines how thermal conductivity in metallic nanostructures changes as their size approaches the mean free path of electrons, revealing decreased conductivity due to increased scattering.
  • Matthiessen's rule, used for assessing electron scattering rates, was experimentally validated as it applies to thin copper films of varying thicknesses and structures.
  • The research finds that while the electron-phonon coupling factor is consistent regardless of thickness, electronic scattering rates rise as film thickness decreases, providing insights for improving thermal management in future electronics.
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Small molecule inhibitors (SMIs) have been gaining attention in the field of area-selective atomic layer deposition (ALD) because they can be applied in the vapor-phase. A major challenge for SMIs is that vapor-phase application leads to a disordered inhibitor layer with lower coverage as compared to self-assembled monolayers, SAMs. A lower coverage of SMIs makes achieving high selectivity for area-selective ALD more challenging.

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Commonly known in macroscale mechanics, buckling phenomena are now also encountered in the nanoscale world as revealed in today's cutting-edge fabrication of microelectronics. The description of nanoscale buckling requires precise dimensional and elastic moduli measurements, as well as a thorough understanding of the relationships between stresses in the system and the ensuing morphologies. Here, we analyze quantitatively the buckling mechanics of organosilicate fins that are capped with hard masks in the process of lithographic formation of deep interconnects.

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