Cubic phase content and structure of BN films from an X-ray absorption study.

X-ray absorption near-edge structure (XANES) was used to study the cubic boron nitride (c-BN) content in the BN films deposited on various substrates by different physical vapor deposition or plasma-enhanced chemical vapor deposition methods. By fitting the XANES curves of thin-film samples using standard spectra of pure c-BN and sp(2)-bonded BN in the films with suitable weight factors, the c-BN contents at the film's surface region and across the film's thickness have been determined quantitatively. The results agree well with the previous transmission electron microscopic observations.

Studying the growth of cubic boron nitride on amorphous tetrahedral carbon interlayers.

The growth of cubic boron nitride (cBN) films on bare silicon and amorphous tetrahedral carbon (ta-C) layers prepared on silicon substrates was studied. The cBN films were prepared by radio frequency magnetron sputter deposition at approximately 870 degrees C. The original ta-C interlayers were graphitized and restructured under high temperature and possibly under ion bombardment during BN deposition.