Pixel-Inconsistency Modeling for Image Manipulation Localization.

Digital image forensics plays a crucial role in image authentication and manipulation localization. Despite the progress powered by deep neural networks, existing forgery localization methodologies exhibit limitations when deployed to unseen datasets and perturbed images (i.e.

No-Reference Image Quality Assessment by Hallucinating Pristine Features.

In this paper, we propose a no-reference (NR) image quality assessment (IQA) method via feature level pseudo-reference (PR) hallucination. The proposed quality assessment framework is rooted in the view that the perceptually meaningful features could be well exploited to characterize the visual quality, and the natural image statistical behaviors are exploited in an effort to deliver the accurate predictions. Herein, the PR features from the distorted images are learned by a mutual learning scheme with the pristine reference as the supervision, and the discriminative characteristics of PR features are further ensured with the triplet constraints.

Accurate aberration correction in confocal microscopy based on modal sensorless method.

Confocal microscopy has the advantages of high resolution and optical sectioning ability over conventional microscopy. However, aberration induced by the optical system can compromise these advantages and considerably reduce the energy reaching the pointlike detector. We propose an accurate aberration correction method with a liquid-crystal spatial light modulator (LCSLM) in the confocal system.

Artifact-free, penetration-adjustable elliptical-mirror-based TIRF microscopy.

Evanescent field distribution in the focal region of the elliptical-mirror-based total-internal-reflection fluorescence (e-TIRF) microscopy is analyzed based on vectorial diffraction theory. The simulation demonstrates that the intensity of an evanescent field generated by elliptical mirror decreases exponentially with the penetration depth, and the polarization characteristic of the evanescent wave in various directions is given. We build up an e-TIRF microscope utilizing a focused hollow-cone illumination with all-direction and large range of incidence.